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تعداد ۹ پاسخ غیر تکراری از ۹ پاسخ تکراری در مدت زمان ۲,۳۰ ثانیه یافت شد.

1. Electronics and communication engineering :

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Author: edited by T. Kishore Kumar, Ravi Kumar Jatoth, V.V. Mani.

Library: Center and Library of Islamic Studies in European Languages (Qom)

Subject: Electrical engineering.,Telecommunication systems-- Design and construction.,Telecommunication systems-- Equipment and supplies.,Telecommunication systems-- Mathematical models.,COMPUTERS-- Networking-- General.,Electrical engineering.,Embedded computer systems.,Integrated circuits-- Very large scale integration.,Microwave antennas.,SCIENCE-- General.,Signal processing-- Digital techniques.,TECHNOLOGY & ENGINEERING-- Mechanical.,Telecommunication systems.,Wireless communication systems.

Classification :
TK5102
.
5
.
N35
2020

2. Integrated circuit defect-sensitivity

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Author: / by Jose Pineda de Gyvez

Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)

Subject: Integrated circuits - Very large scale integration - Design and construction - Data processing,Integrated circuits - Very large scale integration - Defects - Mathematical models,Computer-aided design

Classification :
TK
7874
.
P53
1993

3. Logic design and simulation

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Author:

Library: Central Library of Esfehan University of Technology (Esfahan)

Subject: Logic design►Integrated circuits- Very large scale integration- Design and construction- Data processing►Integrated circuits- Very large scale integration- Mathematical models

Classification :
7868
.
L6
,
L624
1986

4. Logic design and simulation

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Author: edited by E. Horbst

Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)

Subject: ، Logic design,، Integrated circuits -- Very large scale integration -- Design and construction -- Data processing,، Integrated circuits -- Very large scale integration -- Mathematical models

Classification :
TK
7868
.
L6
L624

5. Logic design and simulation

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Author: edited by E. Horbst

Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)

Subject: ، Logic design,Very large scale integration - Desugn and construction - Data processing ، Integrated circuits,Very larg scale integration - Mathematical models ، Integrated circuits

Classification :
TK
7868
.
L6
L624
1986

6. Simulated annealing for VLSI design

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Author: Wong, D. F.

Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)

Subject: Very large scale integration - Design and construction - Data processing ، Integrated circuits,Mathematical models ، Annealing of metals

Classification :
TK
7874
.
W65
1988

7. Statistical modeling for computer-aided design of MOS VLSI circuits

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Author: / Christopher Michael, Mohammed Ismail

Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)

Subject: Metal oxide semiconductors - Design and construction - Statistical methods - Data processing,Metal oxide semiconductors - Mathematical models,Integrated circuits - Very large scale integration - Design and construction - Data processing,Integrated circuits - Very large scale integration - Mathematical models,Computer-aided design

Classification :
TK
7871
.
99
.
M44M53
1993

8. VLSI circuit simulation and optimization

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Author: Litovski, V.

Library: Central Library and Documentation Center (Kerman)

Subject: Design and construction ، Integrated circuits,Data processing ، Integrated circuits - Very large scale integration,Mathematical models ، Integrated circuits - Very large scale integration

Classification :
TK
7874
.
L5
1997

9. Yield simulation for integrated circuits

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Author: Walker, Duncan Moore Henry.

Library: Library of Niroo Research Institue (Tehran)

Subject: ، Integrated circuits- Very large scale integration- Design and construction- Mathematical models,، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Integrated circuits- Very large scale integration- Defects- Mathematical models,، Integrated circuits- Very large scale integration- Defects- Data processing,، Monte Carlo method

Classification :
TK
7874
.
W34
1987
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